VMIVME-2510B 64-bit TTL Digital I/O with Built-in-Test
• The direction of each 8-bit port is individually programmable
• 64 mA sink capability
• Separate board address decoding for control and data registers
• Built-in-Test logic for fault detection and isolation
• Fail LED
• Compatible with VMIC’s Intelligent I/O Controller product line
• High reliability DIN-type I/O connections
• 8-, 16-, 32-bit transfers
• Optional open-collector outputs
Compatibility: VMEbus specification compatible
double-height form factor
I/O Connector Type: Dual 64-pin connector, DIN
41612
I/O Organization: Eight I/O ports; eight bits wide.
Addressable to any address within short supervisory or
short nonprivileged I/O map.
Addressing Scheme: Eight ports individually
addressable on 8- or 16-bit boundaries. Address DIP
switches provide unlimited short data I/O address map
selection.
Built-in-Test: Output data may be read back in
real-time or in an off-line mode. The off-line mode is
enabled by executing a write to the Control and Status
Register (CSR) to set the TEST MODE bits. With the
TEST MODE enabled, all outputs are in TRI-STATE.
Two TEST MODE bits are provided so that each
connector I/O (32 bits) can be tested independently if
necessary.
Fail LED: A Fail LED is provided that is illuminated
at power up and system reset. It may be extinguished
under program control upon a successful diagnostic
execution.
I/O Circuit: Transceivers support high current sink (64
mA) outputs. These octal bus transceivers are
SN74AS645 for the logic level TTL I/O option. The
open-collector option uses SN74AS641 type
transceivers. If the open-collector option is ordered, all
64 bits are output only.
Variations: This product may be purchased in the
following variations:
Model
No. Description
2510 Original Design - one test mode bit
2510A Two test mode bits (one per connector)
2510B Recommended for new designs
(two test mode bits)
